In SR-SIM, a grid pattern is projected onto the image plane. The grid structures interfere with sample structures, creating Moiré fringes. These contain high frequency information (synonymous with high resolution information) transformed down to low frequencies that can be captured by the optical system. Then all you need do is back-compute these lower frequencies to their true value in the final image. In this way you can double the resolution in all three directions.
Put Flexibility First with Structured Illumination
ELYRA S.1 images any fluorophore – with up to twice the resolution of a conventional light microscope.
You have invested a lot of time and energy in producing fusion proteins and multicolor staining protocols that are adapted to your experimental system. Now, with ELYRA S.1, you capture superresolution microscopy data with ease, using samples that may already be available in your lab's freezer. Specially-designed gratings give you the best resolution for each wavelength. Do you need Z-sectioning for 3D data acquisition? A fast, light-efficient detection? Then ELYRA S.1 is your ideal choice.
Illumination module Fully motorized SR-SIM imaging;
five different grating frequencies for SR-SIM for optimal matching of illumination pattern to laser wavelength and objective lens;
motorized exchange of gratings in multi-color SR-SIM; fast piezo actuated phase stepping of gratings;
pattern rotation with adjustable number of angle steps (3 or 5 rotations).
•Camera sCMOS camera mounted on side port (left side port without LSM, right side port with LSM)
•Imaging Modes “Widefield” modes for illumination with X-Cite 120 and lasers, “SIM” mode (three-dimensional SR-SIM),
“LSM mode” (available if combined with LSM 710 or LSM 780)
•Objective lenses (SR-SIM) Plan-APOCHROMAT 63x/1.40 Oil DIC, C-APOCHROMAT 63x/1.20 W Corr, alpha Plan-APOCHROMAT 100x/1,46 Oil DIC,alpha Plan-APOCHROMAT 100x/1.57 Oil-HI DIC Corr
•Resolution (SR-SIM) Lateral resolution (XY): 120 nm, axial resolution (Z): 300 nm (typical experimental FWHM values with objective lens Plan-APOCHROMAT 63x/1.40 Oil DIC, subresolution beads of 40 nm diameter and excitation at 488 nm)
•Multi-color (SR-SIM Mode) Detection of up to four different fluorescent labels (sequential detection)
•Max. Field of view (SR-SIM) 81.25 x 81.25 μm (processed: 78.32 x 78.32 μm), full-frame recording (1280 x 1280 effective px)
with Plan-APOCHROMAT 63x/1.40 Oil DIC
•Acquisition speed (SR-SIM) Image Format Single SR-SIM Frame(2) Time Series(3)
(10 SR-SIM frames)
(2 μm, 16 SR-SIM frames)
1280 x 1280 px (full frame) 1.60 sec 14.2 sec 13.5 sec
512 x 512 px (subarray) 1.55 sec 13.8 sec 12.8 sec
256 x 256 px (subarray) 1.52 sec 13.7 sec 12.5 sec
(2) 15 individual images recorded per SR-SIM frame (at three pattern rotations); 30 ms integration time.
(3) 150 individual images recorded without pausing representing 10 SR-SIM frames (same Z-level); 30 ms integration time.
(4) 240 individual images recorded corresponding to 16 SR-SIM frames at different Z-levels (spacing between Z-levels: 0.133);
30 ms integration time
•Data recording and analysis (SR-SIM) Full software control of SR-SIM imaging;
Multitracking (sequential multi-channel data acquisition with freely configurable change of gratings, filters and excitation lasers between
tracks); SR-SIM imaging in user-defined sub-array regions (ROI imaging);
Extension of imaged area possible with tile scanning and stitching.
Automatic selection and manual editing of processing parameters;
Channel-specific settings of processing parameters in multichannel data;
Selective processing of subsets of original data (subsets of Z-stacks, ROIs);
Batch processing; three types of output computed from original data (SR-SIM, widefield and deconvoluted);
Three processing modes for Z-stack data (“2D”, “3D”, “3D Large”); correction algorithm for chromatic aberration;
Computation and viewing of Fourier transforms.