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AxioVert A1 MAT

AxioVert A1 MAT

Your routine inverted microscope for materials science.  

Download AxioVert A1 MAT PDF

AxioVert A1 User Manual

Microstructural and Structural Analysis: A Question of Contrast.

With Axio Vert.A1 you examine large, heavy samples, using a wide range of classic and advanced contrast methods. Switch easily between brightfield, darkfield, DIC, C-DIC, fluorescence and polarization contrast in reflected light. In transmitted light, use brightfield, polarization and phase contrast. Or combine several contrast methods for the maximum amount of information.

The 5x encoded nosepiece turret recognizes a change of objectives automatically. It also enables the use of a light manager to save and recover light intensity values. You quantify your structure efficiently, evaluate the properties and quality of your materials. Gain valuable new understanding and optimize preparation or production processes. And then take appropriate measures.

  • Fast Imaging with a Wide Range of Objectives
    For your applications you need a variety of objectives. Select the appropriate magnification at all times with the Axio Vert.A1 5x encoded nosepiece turret. Save time and eliminate sources of error: the encoding allows Axio Vert.A1 to automatically recognize your objective.

 

  • Contrast Methods for All Details
    Axio Vert.A1 provides all common contrast methods: with the 4x reflector turret you switch quickly and easily in reflected light between brightfield, darkfield, DIC, C-DIC, fluorescence and polarization contrast, allowing you to examine anisotropic materials such as magnesium and aluminum. Switch to transmitted light illumination and work with brightfield, polarization or phase contrast.

 

  • Reproducible Measuring and Comparing
    Use reticles and structure comparison disks for measuring and counting. In addition, AxioVision Software by Carl Zeiss offers you a powerful range of modules such as grain size, phase analysis, layer thickness and interactive measurement for your investigations.